For the past years, the SWIR band has been recognized as one of the best wavelength regions for semiconductor inspection. Whether it is for detecting cracks and defect on a wafer or solar cell panels, or for achieving a failure analysis of integrated circuits, InGaAs wavelength (900m- 1700nm) imaging device are suited for seeing through inside silicon.
Area Scan SWIR Camera
Our SWIR or Short-Wave Infrared imaging covers the wavelength range from 900nm to 1700nm. A large number of applications that are difficult or impossible to perform using visible light are made possible, with great results, using short-wave infrared (SWIR) imaging thus enabling the user to “See Beyond the Visible”.
Available in USB3, GiGE and Camera Link interface.
Line Scan SWIR Camera
The Wave Series cameras are dual-band 1K line scan cameras capable of sensing Short Wave InfraRed (SWIR) light. The cameras are based on Indium/Gallium/Arsenide (InGaAs) sensor technology and JAI’s prism line scan technology, making them capable of delivering dual-band imaging in the SWIR light spectrum (900 – 1700 nm).