The allPIXA evo 32k line scan camera delivers exceptional resolution and speed by combining advanced CMOS sensors, embedded image processing algorithms, and the latest machine vision interface technologies. Its innovative design integrates two 16k/5 μm lines with a ½ pixel offset, which are captured and processed in real time using state-of-the-art algorithms to produce a superior 32k image—while utilizing standard 16k lenses. This makes the camera an ideal solution for demanding applications such as semiconductor inspection, PCB inspection, AOI, and quality control, where precise sub-pixel defect detection is essential.
