Surface Flaw Detection Scope
Using “OneShotBRDF”, Toshiba’s patented technology
Surface Flaw Detection Scope
Advanced Technology from Toshiba’s Corporate Research & Development Center
- Precision Light Separation: Distinguishes between light reflected off specular surfaces and light scattered by scratches and microdefects, highlighting flaws in distinct colors.
- Instant Clarity: Captures clear images in a single shot, instantly translating microdefect information into color-coded visuals.
- Customizable Filtering: Features a multi-wavelength coaxial aperture filter that can be tailored to meet specific application requirements.
Effortless Flaw Detection:
Identify light scattered by scratches and microdefects in different colors, without the need for image processing on a PC.
Light Detection Technology
Capture inspection targets in one shot and visualize flaws in real time
Capture the faint scattered light reflected from scratches and dents in one shot by using optical inspection technology featuring a multiwavelength coaxial aperture filter that selects the reflection angle of light.
Visualize hard-to-capture microdefects. Can also inspect curved surfaces.
It color separates and visualizes microdefects that are difficult to capture with conventional cameras. It can also be used on inspection targets with curved surfaces, which are hard to capture stably.
Visualize hard-to-discern surface conditions and detect slight dirt and color irregularities
It also color separates and visualizes faint dirt, color irregularities, differing granularities and other differences in surface condition that are hard to discern with conventional cameras.
Applicable to
Glass
Polished Metal
Acrylic
Anodized Aluminum
