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Easy Segment

Deep Learning segmentation library

Easy Segment

EasySegment is the segmentation tool of Deep Learning Bundle. EasySegment performs defect detection and segmentation. It identifies parts that contain defects, and precisely pinpoints where they are in the image.

Neural Networks are computing systems inspired by the biological neural networks that constitute the human brain. Convolutional Neural Networks (CNN) are a class of deep, feed-forward artificial neural networks, most commonly applied to analyzing images. Deep Learning uses large CNNs to solve complex problems difficult or impossible to solve with so-called conventional computer vision algorithms. Deep Learning algorithms may be easier to use as they typically learn by example. They do not require the user to figure out how to classify or inspect parts. Instead, in an initial training phase, they learn just by being shown many images of the parts to be inspected. After successful training, they can be used to classify parts, or detect and segment defects.

 

The Highlight Features

 

  • Unsupervised mode: train only with “good” images to detect and segment anomalies and defects in new images
  • Supervised mode: learn a model of the defects for better segmentation and detection precision
  • Works with any image resolution
  • Supports data augmentation and masks
  • Compatible with CPU and GPU processing
  • Includes the free Deep Learning Studio application for dataset creation, training and evaluation
  • Only available as part of the Deep Learning Bundle

Key Features

Key Features

What is EasySegment good for?

Deep Learning is generally not suitable for applications requiring precise measurement or gauging. It is also not recommended when some types of errors (such as false negative) are completely unacceptable. The unsupervised mode of EasySegment is good for defect detection and segmentation tasks, especially when defectives samples are hard to come by. Deep Learning tools usually work very well with images of natural or manufactured objects that have complex surface patterns (e.g. wood, fabric, …) that make the detection of defects by conventional machine vision algorithm very hard. Besides, the “learn by example” paradigm of Deep Learning can also reduce the development time of a computer vision process.

EasySegment Unsupervised mode

EasySegment is the segmentation tool of Deep Learning Bundle. EasySegment performs defect detection and segmentation. It identifies parts that contain defects, and precisely pinpoints where they are in the image. The unsupervised mode of EasySegment works by learning a model of what is a “good” sample (i.e. a sample without any defect). This is done by training it only with images of “good” samples. Then, the tool can be used to classify new images as good or defective and segment the defects from these images. By training only with images of good samples, the unsupervised mode of EasySegment is able to perform inspection even when the type of defect is not known beforehand or when defective samples are not readily available.

EasySegment supervised mode

EasySegment is the segmentation tool of Deep Learning Bundle. EasySegment performs defect detection and segmentation. It identifies parts that contain defects, and precisely pinpoints where they are in the image. The supervised mode of EasySegment works by learning a model of what is a defect and what is a “good” part in an image. This is done by training with images annotated with the expected segmentation. Then, the tool can be used to detect and segment the defects in new images. The supervised mode of EasySegment achieves better precision and can segment more complex defects than the unsupervised mode thanks to the knowledge of the expected segmentation.

Sample Dataset: Foreign Material Detection and Segmentation

Our “Coffee” sample dataset shows how the supervised mode of EasySegment can be used to efficiently detect and segment foreign materials on a production line, even when the foreign materials’ color and texture are very close to the product of interest.

Sample Dataset: Fabric Defect Detection

Our “Fabric” sample dataset shows how the unsupervised mode of EasySegment can be used to detect and segment defects in Fabric with only a few good samples for training and no knowledge about what kind of defects are expected. Moreover, the unsupervised mode of EasySegment can be used to ease the annotation of the expected segmentation required for the supervised mode by reviewing and importing the results of the unsupervised mode as ground truth.

eVisionNeoLicensingSystem

Supported by Neo Licensing System

DeepLearningStudioClassify

Deep Learning Studio assists the user during the creation of the dataset as well as the training and testing of the deep learning tool.

Performance

Deep Learning Bundle supports standard CPUs and automatically detects Nvidia CUDA-compatible GPUs in the PC. Using a single GPU typically accelerates the learning and the processing phases by a factor of 100.

DataAugmentation-2

Data Augmentation which creates additional reference images by modifying (for example by shifting, rotating, scaling) existing reference images within programmable limits.

Extra Note

  1. All Open eVision libraries are available for Windows and Linux
  2. Developed with the support of the DG06 Technology Development Department

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